Introduction to Oxford Nanopore Technology data analysesThis course offers an introduction to ONT data analysis. It includes 5 issues: basecalling, reads quality control, assemblies and polishing/correction, contig quality and structural variants detection. |
Prerequisites
Linux and knowledge of NGS formats
Program
- Introduction to the principles of the technology (kits, flowcell)
- Principles of basecalling
- Handling mapping and assembly tools suitable for ONT data
- How to polish and correct an assembly
- Detecting structural variations with long reads
Learning objectives
- Understanding limits and advantages of ONT technology
- Manipulating ONT data on a virtual machine on jupyter environment
- Handling mapping, assembly, polishing tools and be able to analyse your own data
- Detecting structural variations using long reads
Instructors
- Julie Orjuela (JO) - julie.orjuela@ird.fr
- Francois Sabot (FS) - francois.sabot@ird.fr
- Gautier Sarah (GS) - gautier.sarah@inrae.fr
Trainings
Date | Location | Topics | Participants | Instructors | Links | Units |
---|---|---|---|---|---|---|
2021 | Zoom from Montpellier, France | Introduction to ONT data analyses | 14 | JO, FS, GS | UMR DIADE, AGAP |